Molecular Vista
Publications | Anfatec Instruments AG
Publications with the Anfatec USBLockIn250
K. Adhitya, A. Alsulami, A. Buckley, R. C. Tozer, and Martin Grell:
Intensity-Modulated Spectroscopy on Loaded Organic Photovoltaic Cells
IEEE JOURNAL OF PHOTOVOLTAICS, VOL. 5, NO. 5, SEPTEMBER 2015, p. 1414-1421. DOI: 10.1109/JPHOTOV.2015.2447838
Intensity-Modulated Spectroscopy on Loaded Organic Photovoltaic Cells
IEEE JOURNAL OF PHOTOVOLTAICS, VOL. 5, NO. 5, SEPTEMBER 2015, p. 1414-1421. DOI: 10.1109/JPHOTOV.2015.2447838
Todor M. Mishonov, Emil G. Petkov, Iglika M. Dimitrova, Nikola S. Serafimov, Albert M. Varonov:
Probability distribution function of crossover frequency of operational amplifiers
Measurement Volume 179, July 2021, 109509
DOI: 10.1016/j.measurement.2021.109509
Probability distribution function of crossover frequency of operational amplifiers
Measurement Volume 179, July 2021, 109509
DOI: 10.1016/j.measurement.2021.109509
Todor M. Mishonov, Iglika M. Dimitrova, Nikola S. Serafimov, Emil G. Petkov, Albert M. Varonov:
Q-Factor of the Resonators With Frequency Dependent Negative Resistor
IEEE Transactions on Circuits and Systems II: Express Briefs, Volume: 69, Issue: 3, p. 694-698
DOI: 10.1109/TCSII.2021.3111488
Q-Factor of the Resonators With Frequency Dependent Negative Resistor
IEEE Transactions on Circuits and Systems II: Express Briefs, Volume: 69, Issue: 3, p. 694-698
DOI: 10.1109/TCSII.2021.3111488
Selected Publications with the Anfatec AFM
T. Slobodskyy, A. V. Zozulya, R. Tholapi, L. Liefeith, M. Fester, M. Sprung, and W. Hansen:
Versatile atomic force microscopy setup combined with micro-focused X-ray beam
Review of Scientific Instruments 86, 065104 (2015)
DOI: 10.1063/1.4922605
Versatile atomic force microscopy setup combined with micro-focused X-ray beam
Review of Scientific Instruments 86, 065104 (2015)
DOI: 10.1063/1.4922605
C. Belgardt, T. Blaudeck, C. von Borczyskowski, H. Graaf
Self-Assembly of Ordered Colloidal
Nanoparticle Films in Few-Micron Wide Laser-Desorbed Lines of
Octadecylsiloxane Monolayers on Silicon Oxide Surfaces
Adv. Eng. Mater. 16 (9), 1090-1097 (2014).
Adv. Eng. Mater. 16 (9), 1090-1097 (2014).
Chr. Belgardt , E. Sowade , Th. Blaudeck , Th. Baumgärtel , H. Graaf , Chr. von Borczyskowski and R. R. Baumann:
Inkjet printing as a tool for the patterned deposition of octadecylsiloxane monolayers on silicon oxide surfaces
Phys. Chem. Chem. Phys. 15 (20), 7494-7504 (2013)
DOI: 10.1039/C3CP50331C
Inkjet printing as a tool for the patterned deposition of octadecylsiloxane monolayers on silicon oxide surfaces
Phys. Chem. Chem. Phys. 15 (20), 7494-7504 (2013)
DOI: 10.1039/C3CP50331C
T. Baumgärtel, C. v. Borczyskowski and H. Graaf:
Detection and stability of nanoscale space charges in local oxidation nanolithography
IOP PUBLISHING Nanotechnology 23, 095707 (2012)
DOI: 10.1088/0957-4484/23/9/095707
C. Baumgart, A.-D. Müller, F. Müller, H. Schmidt:
Kelvin probe force microscopy in the presence of intrinsic local electric fields
phys. stat. sol. (a), 208, 777-789 (2011)
(Editor’s choice and Back cover)
DOI:
Kelvin probe force microscopy in the presence of intrinsic local electric fields
phys. stat. sol. (a), 208, 777-789 (2011)
(Editor’s choice and Back cover)
DOI:
Daniel Russo, Randy D. Fagan, and Thorsten Hesjedal:
An Undergraduate Nanotechnology Engineering Laboratory Course on Atomic Force Microscopy
IEEE Tansactions On Education 54 (3), 0018-9359 (2010)
DOI: 10.1109/TE.2010.2066566
An Undergraduate Nanotechnology Engineering Laboratory Course on Atomic Force Microscopy
IEEE Tansactions On Education 54 (3), 0018-9359 (2010)
DOI: 10.1109/TE.2010.2066566
C. Baumgart, M. Helm, and H. Schmidt:
Quantitative dopant profiling in semiconductors: A Kelvin probe force microscopy model
Phys. Rev. B 80, 085305 (2009)
DOI: 10.1103/PhysRevB.80.085305
Quantitative dopant profiling in semiconductors: A Kelvin probe force microscopy model
Phys. Rev. B 80, 085305 (2009)
DOI: 10.1103/PhysRevB.80.085305
R. Scholz, D. Lehmann, A.-D. Müller, F. Müller and D. R. T. Zahn:
Potentiometry on pentacene OFETs: Charge carrier mobilities and injection barriers in bottom and top contact configurations
phys. stat. sol. (a), 1–9 (2008)
DOI:
Potentiometry on pentacene OFETs: Charge carrier mobilities and injection barriers in bottom and top contact configurations
phys. stat. sol. (a), 1–9 (2008)
DOI:
R. Scholz, A.-D. Müller, F. Müller, I. Thurzo, B.A. Paez, L. Mancera,
D.R.T. Zahn, C. Pannemann, U. Hilleringmann:
Comparison between the charge carrier mobilities in pentacene OFET structures as obtained from electrical characterization and potentiometry
Proceedings of SPIE 5940, 594000I-1 (2005)
TU-Chemnitz.de
Comparison between the charge carrier mobilities in pentacene OFET structures as obtained from electrical characterization and potentiometry
Proceedings of SPIE 5940, 594000I-1 (2005)
TU-Chemnitz.de
Selected Publications of Anne and Falk
A.-D. Müller, F. Müller:
Frequency dependent Kelvin Probe Force Microscopy on Silicon
J. Vac. Sci. Technol. B 27 (2), 969 (2009)
DOI: 10.1116/1.3039682
B. Graffel, F. Müller, A.-D. Müller, M. Hietschold:
Feedforward correction of nonlinearities in piezoelectric scanner constructions and its experimental verification
Rev. Sci. Instr. 78, 053706 (2007)
DOI: 10.1063/1.2736786
Feedforward correction of nonlinearities in piezoelectric scanner constructions and its experimental verification
Rev. Sci. Instr. 78, 053706 (2007)
DOI: 10.1063/1.2736786
Anne-D. and Falk Müller:
Xilinx PROM Programmer - Parallel port serial PROM burner
Elektor 10/2003, S. 68 (pushlished in 4 languages)
Elektor.com
Xilinx PROM Programmer - Parallel port serial PROM burner
Elektor 10/2003, S. 68 (pushlished in 4 languages)
Elektor.com
A.-D. Müller, F. Müller, J. Middeke, J. Mehner, J. Wibbeler, Th. Gessner, M. Hietschold:
Double-cantilever device for Atomic Force Microscopy in dynamic noncontact-mode
Microelectron. Reliab. 42 (9-11), 1685 (2001)
DOI: 10.1016/S0026-2714(02)00212-3
Double-cantilever device for Atomic Force Microscopy in dynamic noncontact-mode
Microelectron. Reliab. 42 (9-11), 1685 (2001)
DOI: 10.1016/S0026-2714(02)00212-3
F. Müller, A.-D. Müller, G. Schmid:
Electronic properties of selfassembled monolayers on Au(111) studied by Electrical Force Spectroscopy
Phys. Rev. B 63 (20), 205403 (2001)
DOI: 10.1103/PhysRevB.63.205403
Electronic properties of selfassembled monolayers on Au(111) studied by Electrical Force Spectroscopy
Phys. Rev. B 63 (20), 205403 (2001)
DOI: 10.1103/PhysRevB.63.205403
A.-D. Müller, F. Müller, M. Kröll, G. Schmid:
Highly resolved electrical force microscopy study on metal filled anodic alumina
Appl. Surf. Sci. 171, 125-129 (2001)
DOI: 10.1016/S0169-4332(00)00554-7
Highly resolved electrical force microscopy study on metal filled anodic alumina
Appl. Surf. Sci. 171, 125-129 (2001)
DOI: 10.1016/S0169-4332(00)00554-7
A.-D. Müller, F. Müller, M Hietschold, F. Demming, J. Jersch, K. Dickmann:
Characterization of electrochemically etched tungsten tips for Scanning Tunneling Microscopy
Rev. Sci. Instr. 70 (10), 3970-72 (1999)
DOI: 10.1063/1.1150022
Characterization of electrochemically etched tungsten tips for Scanning Tunneling Microscopy
Rev. Sci. Instr. 70 (10), 3970-72 (1999)
DOI: 10.1063/1.1150022
A.-D. Müller, F. Müller, M. Hietschold:
Detecting work function differences in Scanning Tunneling Microscopy
Appl. Phys. Lett. 74 (20), 2963-65 (1999)
DOI: 10.1063/1.123980
Detecting work function differences in Scanning Tunneling Microscopy
Appl. Phys. Lett. 74 (20), 2963-65 (1999)
DOI: 10.1063/1.123980
F. Müller, A.-D. Müller, M. Hietschold, S. Kämmer:
Detecting electrical forces in noncontact Atomic Force Microscopy
Meas. Sci. Technol. 9, 734 (1998)
DOI: 10.1088/0957-0233/9/5/002
Detecting electrical forces in noncontact Atomic Force Microscopy
Meas. Sci. Technol. 9, 734 (1998)
DOI: 10.1088/0957-0233/9/5/002
F. Müller, A.-D. Müller, O. Meissner, A. Heilmann, M. Hietschold:
Enhanced local surface conductivity measurements by STM
Rev. Sci. Instr. 68 (8), 3104-3106 (1997)
DOI: 10.1063/1.1148250
Enhanced local surface conductivity measurements by STM
Rev. Sci. Instr. 68 (8), 3104-3106 (1997)
DOI: 10.1063/1.1148250
Show our Clients