Anfatec Instruments AG
Measurement Science and Technology &
Scanning Probe Microscopy


System parameters:

lateral resolution better than 5 nm (at standard samples)
height resolution better than 0,4 nm (atomic steps)
maximum scan range 30 m (standard, others possible on request)
maximum sample size 4 cm x 4 cm
manual positioning range 5 mm x 5 mm
accessories 130 cantilevers of different types, small empty cantilever boxes, tweezers, sample holders, over 15 different samples