Anfatec Instruments AG
Measurement Science and Technology &
Scanning Probe Microscopy



Magnetic Force Microscopy



In Magnetic Force Microscopy (MFM), each line of the images is taken twice: the first trace is used to get the topography information. The 2nd trace is following the topography in a certain height of several nm and mainly detects long range interactions, such as interactions caused by magnetic forces. MFM employs cantilevers with a magnetic coating, usually CrCo coated silicon tips.





Topography (left) and MFM Amplitude (right) images of a Bruker reference sample for MFM. Image Size: 1.5 Ám x 1.5 Ám.




Topography (left) and MFM Phase (right) images of a Bruker reference sample for MFM. Image size: 40 Ám x 40 Ám.